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Use of debuggers in hardware-in-the-loop testing
Testing from Module Testing to System Testing Author: Kristian Trenkel, iSyst Intelligente Systeme GmbH Contribution - Embedded Software Engineering Congress 2016 This contribution explains the use of debuggers for hardware-in-the-loop (HIL) testing. Two application areas are presented: for...
Consistent metrics for determining testing activities
Always know how far development has progressed. Author: Ingo Nickles, Vector Software. Contribution - Embedded Software Engineering Congress 2016. In modern software development, new functionalities must be implemented at increasingly shorter intervals. The source code is becoming ever more...
Efficient unit testing in C++ and C
Proven Ways to Isolate and Test Embedded Code Author: Franco Chiappori, Schindler Elevators AG Contribution - Embedded Software Engineering Congress 2016 Continuous integration and automated tests are proven methods for improving software quality. Especially automated...
Effective Power Interruption Testing
How to Fail Best Author: Thom Denholm, Datalight Inc. Contribution - Embedded Software Engineering Congress 2017 From dropped batteries to system failures, embedded designs require solid power interruption testing. Durability demands for embedded products have increased as the expected lifetime of high...
Quality on demand
Outsourcing in Agile Software Development Processes Author: Dr. Hartmut Lackner, Model Engineering Solutions GmbH Contribution - Embedded Software Engineering Congress 2017 Outsourcing testing services delivers faster and better results than using internal resources -...
Hardware-in-the-Loop and Software-in-the-Loop Tests for Everyone
Test First for Embedded Systems Author: Thomas Schütz, PROTOS Software GmbH, Toolchains for Embedded Software Contribution - Embedded Software Engineering Congress 2017 Most embedded systems are tested too late or only inadequately. The fact is: the later errors are discovered, the more expensive they are...
Don't be afraid of software variations.
Test Case Reuse and Inheritance Author: Michael Wittner, Razorcat Development Contribution - Embedded Software Engineering Congress 2017 The challenge in testing software variants is that each variant must be fully tested. The following is a method...
Successful tradition meets dynamic modernity
Introduction to Requirements- and Model-Driven Development Author: Kai Gloth, Sartorius Lab Instruments Contribution - Embedded Software Engineering Congress 2017 For every part of product or instrument development and the associated processes, there are countless books and guides....