{"id":7778,"date":"2025-11-29T05:53:25","date_gmt":"2025-11-29T04:53:25","guid":{"rendered":"https:\/\/web-dev-weissblau.de\/microconsult\/?p=7778"},"modified":"2026-02-13T16:15:29","modified_gmt":"2026-02-13T15:15:29","slug":"combinatorial-state-transition-tests-for-embedded-systems","status":"publish","type":"post","link":"https:\/\/www.microconsult.de\/en\/kombinatorische-state-transition-tests-fuer-embedded-systems\/","title":{"rendered":"Combinatorial State Transition Tests for Embedded Systems"},"content":{"rendered":"<h2>High test coverage achieved quickly<\/h2>\n<p style=\"text-align: left;\" align=\"center\">Author: Thomas Sch\u00fctz, PROTOS Software GmbH<\/p>\n<h3>Contribution \u2013 Embedded Software Engineering Congress 2018<\/h3>\n<p><strong>State-transition tests are recommended in many standards for safety-critical systems. However, they are an excellent method for all embedded systems to achieve high test coverage quickly and systematically.<\/strong><\/p>\n<h2>Methods for deriving test cases<\/h2>\n<p>The most well-known methods for deriving test cases are:\u00a0<em>Equivalence classes<\/em>\u00a0and\u00a0<em>Limit value analysis<\/em>. They are typically used in unit tests in conjunction with code coverage measurements.\u00a0<em>(C0, C1, \u2026)<\/em>\u00a0They are used to check the completeness of the tests. However, asynchronous concurrent components, such as those used in embedded systems, are very difficult to test with synchronous sequential unit tests. These test methods are also hardly suitable for integration or system tests based on hardware or software in the loop.<\/p>\n<p><em>State Transition Tests<\/em>\u00a0are less widely used. However, they offer excellent possibilities for testing complex, concurrent software with high coverage. This makes it possible to define path coverage for the state space of the application under test (<em>n-switch<\/em>The required test cases can be derived or generated manually. By appropriately applying the method, even tests for data combinatorics (<em>n-wise<\/em>) carry out.<\/p>\n<p>See Fig. 1 (<a title=\"Technical information_ESE_state-transition-test_protos_schuetz\" href=\"https:\/\/www.microconsult.de\/wp-content\/uploads\/2025\/12\/fachinfo_ese_state-transition-test_protos_schuetz.pdf\" target=\"_blank\" rel=\"noopener\">PDF<\/a>): Test Coverage Metrics for State Transition Tests<\/p>\n<h2>The methodology of the state-transition test with path coverage<\/h2>\n<p>State-transition tests, as black-box tests, first define all externally accessible states of the system under test (SUT) in a state-transition diagram. Transitions describe all state changes between system states. Every path from the initial state (initial) to the final state (end) is a possible test path and thus a possible test case. To achieve complete transition and state coverage (0-switch), the paths of all generated test cases must collectively traverse each transition at least once.<\/p>\n<p>See Fig. 2 (<a title=\"Technical information_ESE_state-transition-test_protos_schuetz\" href=\"https:\/\/www.microconsult.de\/wp-content\/uploads\/2025\/12\/fachinfo_ese_state-transition-test_protos_schuetz.pdf\" target=\"_blank\" rel=\"noopener\">PDF<\/a>Execution paths for test cases in the state-transition diagram<\/p>\n<p>Higher coverages define the combination of consecutive transitions:<\/p>\n<ul>\n<li><em>0-switch:<\/em>\u00a0Each transition was completed at least once.<br \/>\nThis coverage already includes full coverage of the states.<\/li>\n<li><em>1-switch:<\/em>\u00a0All combinations of two consecutive transitions<\/li>\n<li><em>n-switch:<\/em>\u00a0All combinations of n+1 consecutive transitions<\/li>\n<\/ul>\n<p>The high path coverage allows the tests to uncover many problems. One example of this is sporadically occurring issues.\u00a0<em>Race Conditions<\/em>. These are difficult to detect using most other methods.<\/p>\n<h2>Tests for data combinatorics<\/h2>\n<p>State-transition tests are also well-suited for testing data combinations. In this example, all combinations of two parameters, each with three values, are tested against each other. This corresponds to the\u00a0<em>pairwise<\/em>\u00a0Test. Combinations of more parameters are also possible (<em>n-wise<\/em>) can be easily generated. The necessary values for the individual parameters can be easily determined using\u00a0<em>Equivalence classes<\/em>\u00a0and\u00a0<em>Limit value analysis<\/em>\u00a0can be derived.<\/p>\n<p>See Fig. 3 (<a title=\"Technical information_ESE_state-transition-test_protos_schuetz\" href=\"https:\/\/www.microconsult.de\/wp-content\/uploads\/2025\/12\/fachinfo_ese_state-transition-test_protos_schuetz.pdf\" target=\"_blank\" rel=\"noopener\">PDF<\/a>): Description of data combinatorics using state-transition diagrams<\/p>\n<h2>Combination and generation of data and path coverage<\/h2>\n<p>Data and path coverage can also be effectively combined. For example, for all combinations of 3 parameters (<em>n-wise<\/em>) all flow paths (<em>n-switch<\/em>) tested.<\/p>\n<p>Since the large number of necessary test cases can hardly be developed manually anymore, the use of suitable tools with test case generators is recommended for larger coverage areas.<\/p>\n<p>See Fig. 4 (<a title=\"Technical information_ESE_state-transition-test_protos_schuetz\" href=\"https:\/\/www.microconsult.de\/wp-content\/uploads\/2025\/12\/fachinfo_ese_state-transition-test_protos_schuetz.pdf\" target=\"_blank\" rel=\"noopener\">PDF<\/a>): Combination of data and path coverage<\/p>\n<h2>Analysis and documentation of test procedures<\/h2>\n<p>Different perspectives can be used to analyze, understand, and document the resulting test cases.<\/p>\n<ul>\n<li><em>Execution trees<\/em>\u00a0provide an overview of all generated test paths and their different processes.<\/li>\n<li><em>Sequence diagrams<\/em>\u00a0They depict individual test sequences and their interaction with the system under test in great detail. A target\/actual comparison of the sequences enables the rapid analysis and narrowing down of error causes.<\/li>\n<\/ul>\n<p>See Fig. 5 (<a title=\"Technical information_ESE_state-transition-test_protos_schuetz\" href=\"https:\/\/www.microconsult.de\/wp-content\/uploads\/2025\/12\/fachinfo_ese_state-transition-test_protos_schuetz.pdf\" target=\"_blank\" rel=\"noopener\">PDF<\/a>): Different views on the generated test cases<\/p>\n<h2>Conclusion<\/h2>\n<ul>\n<li>State-transition tests are a structured method for developing tests for concurrent embedded systems.<\/li>\n<li>State-transition tests enable the development of combinatorial test cases for high path and data coverage.<\/li>\n<li>Small covers can be developed manually. For larger covers, the use of tools is recommended.<\/li>\n<\/ul>\n<h2>author<\/h2>\n<p>Thomas Sch\u00fctz studied aerospace engineering in Munich and founded PROTOS Software GmbH in 1997. As a software project manager and architect, he has contributed his experience in combining model-based approaches with the requirements of embedded systems to numerous projects. Thomas Sch\u00fctz advises companies on the development of domain-specific toolchains and test systems for embedded systems and is the project manager of the Eclipse project eTrice.<\/p>\n<p><a title=\"Technical information_ESE_state-transition-test_protos_schuetz\" href=\"https:\/\/www.microconsult.de\/wp-content\/uploads\/2025\/12\/fachinfo_ese_state-transition-test_protos_schuetz.pdf\" target=\"_blank\" rel=\"noopener\"><strong>Download the article as a PDF<\/strong><\/a><\/p>\n<hr \/>\n<h2>Testing, Quality &amp; Debugging \u2013 Our Training &amp; Coaching<\/h2>\n<p><strong>Do you want to bring yourself up to date with the latest technology?<\/strong><\/p>\n<p>Then find out more\u00a0<a title=\"Test &amp; Debug Training and Coaching\" href=\"https:\/\/www.microconsult.de\/en\/all-training-dates-complete-overview\/\" target=\"_blank\" rel=\"noopener\"><strong>here<\/strong>\u00a0<\/a>MircoConsult offers training courses\/seminars\/workshops and individual coaching on the topics of testing, quality &amp; debugging.<\/p>\n<p><strong>Training &amp; coaching on the other topics in our portfolio can be found here.\u00a0<a title=\"Training &amp; Consulting - all topics\" href=\"https:\/\/www.microconsult.de\/en\/training-beratung\/\" target=\"_blank\" rel=\"noopener\">here<\/a>.<\/strong><\/p>\n<hr \/>\n<h2>Testing, Quality &amp; Debug \u2013 Expertise<\/h2>\n<p>Valuable expertise on the topics of testing, quality &amp; debugging is available.\u00a0<a title=\"Test and Debug\" href=\"https:\/\/www.microconsult.de\/en\/test-and-debug\/\" target=\"_blank\" rel=\"noopener\"><strong>here<\/strong>\u00a0<\/a>Available for you to download free of charge.<\/p>\n<p><a title=\"Test and Debug\" href=\"https:\/\/www.microconsult.de\/en\/test-and-debug\/\" target=\"_blank\" rel=\"noopener\"><strong>To the specialist information<\/strong><\/a><\/p>\n<p><strong>You can find expertise on other topics in our portfolio here. <a title=\"Technical information\" href=\"https:\/\/www.microconsult.de\/en\/specialist-knowledge\/\" target=\"_blank\" rel=\"noopener\">here<\/a>.<\/strong><\/p>","protected":false},"excerpt":{"rendered":"<p>Hohe Testabdeckungen schnell erreicht Autor: Thomas Sch\u00fctz, PROTOS Software GmbH Beitrag &#8211; Embedded Software Engineering Kongress 2018 State-Transition Tests werden in vielen Standards f\u00fcr sicherheitskritische Systeme empfohlen. Sie sind aber f\u00fcr alle Embedded Systems eine hervorragende Methode, um schnell und strukturiert hohe Testabdeckungen zu erreichen. Methoden zur Ableitung von Testcases Die bekanntesten Methoden zur Ableitung [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","inline_featured_image":false,"footnotes":""},"categories":[],"tags":[],"class_list":["post-7778","post","type-post","status-publish","format-standard","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Kombinatorische State-Transition Tests f\u00fcr Embedded Systems - MicroConsult Academy GmbH<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.microconsult.de\/en\/combinatorial-state-transition-tests-for-embedded-systems\/\" \/>\n<meta property=\"og:locale\" content=\"en_GB\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Kombinatorische State-Transition Tests f\u00fcr Embedded Systems - MicroConsult Academy GmbH\" \/>\n<meta property=\"og:description\" content=\"Hohe Testabdeckungen schnell erreicht Autor: Thomas Sch\u00fctz, PROTOS Software GmbH Beitrag &#8211; Embedded Software Engineering Kongress 2018 State-Transition Tests werden in vielen Standards f\u00fcr sicherheitskritische Systeme empfohlen. 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